Aachen 2019 – scientific programme

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T: Fachverband Teilchenphysik

T 20: Detektorsysteme I

T 20.10: Talk

Monday, March 25, 2019, 18:15–18:30, ST 4

Measurement and optimization of the soft-error-recovery rates in the phase 1 pixel detector — •Torben Lange¹, Peter Schleper¹, Benedikt Vormwald¹, Jory Sonneveld¹, Klaas Padeken², Abhisek Datta³, and Atanu Modak⁴ — ¹Univeristät Hamburg, Germany — ²Vanderbilt University, US — ³Cornell University, US — ⁴Kansas State University, US

While constructed in a radiation hard way to operate in the high radiation environment at the center of the CMS experiment, single-event upsets or SEU that cause different parts of the silicon-pixel-tracking detector to stop sending data are unavoidable in a system this close to the interaction point. The soft-error recovery is an automated procedure to recover those detector parts that stop sending data after radiation induced SEUs during operation. This talk gives an overview of trigger- and recovery rates for the soft-error recovery and discusses based on this if and how the trigger thresholds for the soft-error recovery could be adjusted for the RUN-3 of LHC data taking.