Aachen 2019 – scientific programme
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T: Fachverband Teilchenphysik
T 20: Detektorsysteme I
T 20.6: Talk
Monday, March 25, 2019, 17:15–17:30, ST 4
Performance studies of Belle II DEPFET Pixel Half-Ladders in Test Beams — •Julian Soltau, Philipp Wieduwilt, Harrison Schreeck, Benjamin Schwenker, and Ariane Frey — Georg-August-Universität Göttingen
In the momentary ongoing upgrade of the Japanese Flavor Factory (KEKB) to SuperKEKB for the Belle II experiment the luminosity targets a luminosity increase to 8 · 1035 cm−2 s−1, which is 40 times higher than the previous luminosity of the Belle experiment. In order to handle the increased data rate, a new detector design is mandatory. This was realized by adding an additional pixel detector to the vertex detector, based on DEPFET technology. The DEPFET pixels have a completely depleted silicon bulk and combine signal detection and amplification in a single chip. As part of a beam test campaign at DESY the influence on the the efficiency of different bulk bisasing settings was tested on different half-ladders. The half-ladders used were final PXD modules with pixel sizes in the range of (55−85) × 55µm2. The results from the beam test will be presented in this talk.