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Regensburg 2019 – scientific programme

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DS: Fachverband Dünne Schichten

DS 25: Thin Film Properties: Structure, Morphology and Composition (XRD, TEM, XPS, SIMS, RBS, AFM, ...) Part II

DS 25.3: Talk

Friday, April 5, 2019, 10:00–10:15, H32

Valence profiling of LaMnO3/SrTiO3 by use of resonant X-ray reflectometry and crystal field theory — •Michael Dettbarn1, Volodymyr B. Zabolotnyy1, Robert Green2, Michael Zapf1, Kirill Miller1, Matthias Schmitt1, Enrico Schierle3, Michael Sing1, Ralph Claessen1, and Vladimir Hinkov11Universität Würzburg and Röntgen Center for Complex Material Systems (RCCM), Würzburg — 2University of Saskatchewan, Saskatoon, Canada — 3HZB, Berlin

We have measured resonant X-ray reflectivity (RXR) and X-ray absorption spectra (XAS) on a bulk stoichiometric La7/8Sr1/8MnO3 sample and three thin LaMnO3 films of 3, 12 and 30 u.c. thickness. The manganese in the La7/8Sr1/8MnO3 sample can be modeled by a 3+ valence, whose line shape we fit theoretically by use of crystal-field theory, including a Jahn-Teller distortion.

We model the RXR spectra of the three LaMnO3 films by a mixture of Mn3+ and Mn2+ contributions, and deduce the depth profiles of the two different valencies. We compare our results with previous microscopy studies, in which a preferred occurrence of Mn2+ near the interface and surface regions was observed.

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