Regensburg 2019 – wissenschaftliches Programm
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MM: Fachverband Metall- und Materialphysik
MM 35: Topical session (Symposium MM): Correlative and in-situ Microscopy in Materials Research
MM 35.2: Vortrag
Donnerstag, 4. April 2019, 10:45–11:00, H45
Characterization of surface reactions by non-contact atomic force microscopy with functionalized tips — •Andreas Dörr1, Maximilian Ammon1, Van-Dong Pham1, Milan Kivala2, and Sabine Maier1 — 1Department of Physics, Friedrich-Alexander-Universität Erlangen-Nürnberg, Erlangen — 2Centre for Advanced Materials, Ruprecht-Karls-Universität Heidelberg, Heidelberg
Atomically resolved images of surface-supported molecular structures have been achieved using non-contact atomic force microscopy (nc-AFM) with functionalized tips.[1] The key step involves the attachment of suitable small molecules, e.g. CO, to achieve high spatial resolution. Submolecular resolution imaging is a versatile tool to unravel novel reaction pathways of surface-supported molecules in on-surface synthesis. Here, we present a low-temperature scanning tunneling microscopy and nc-AFM study with functionalized tips to understand the on-surface reaction of amine-functionalized carbonyl-bridged triphenylamine derivatives. On Au(111), we observe linear structures upon reaction, while on Ag(111), covalently-linked dimers are formed that connect to 2D structures at higher temperatures. However, the molecular structure of the polymerized reaction products is found to be similar on both surfaces. The nc-AFM measurements with CO functionalized tips indicate that mainly the amine-groups are involved in the polymerization reaction. We will discuss the geometric structure of the reaction products and the reaction kinetics on both surfaces.
[1] L. Gross, et al. Science 325, 1110 (2009)