Regensburg 2019 – wissenschaftliches Programm
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MM: Fachverband Metall- und Materialphysik
MM 9: Topical session (Symposium MM): Correlative and in-situ Microscopy in Materials Research
MM 9.9: Vortrag
Montag, 1. April 2019, 18:30–18:45, H44
Structural studies on functional and solution-processed organic thin films — •Tim Hawly1, Manuel Johnson1, and Rainer Fink1,2 — 1Lehrstuhl für Physikalische Chemie II, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany — 2CENEM, Friederich-Alexander-Universität Erlangen-Nürnberg, Germany
State-of-the-art organic semiconducting layers offer a variety of advantages compared to conventional inorganic circuitry such as flexibility, low-cost processability and environmental compatibility. However, numerous experiments including vacuum-processed thin films in devices such as organic field-effect transistors (OFETs) suffer from diffusion-limited growth leading to polycrystalline films, which reduce high-mobility charge transport between the source and drain electrode. We utilized spatially resolved XPS to obtain insight into the operating, active layer of a typical OFET. We explored a novel preparation technique utilizing the surface of a liquid (most commonly water) as substrate.[1] Thin-film growth out of solution results in long-range ordered crystalline structures for a variety of small molecules and is ultimately capable of overcoming common domain sizes and grain boundaries present in vacuum-deposited films. Our findings are readily supported by microscopic (AFM, TEM), diffraction (SAED) and spectroscopic (Angle-resolved NEXAFS, STXM) techniques as well as by charge-transport measurements that excel reference data typically by one order in magnitude. This research is funded by the DFG within GRK1896. [1]: C. Xu et al., Angew. Chem. Int. Ed. 2016, 55, 9519-9523.