Regensburg 2019 – wissenschaftliches Programm
O 17.9: Poster
Montag, 1. April 2019, 17:45–20:00, Poster F
Intercalation of gold between graphene and silicon carbide studied by PEEM and XPS — •Philipp Weinert, Richard Hönig, Peter Roese, Karim Shamout, Malte Schulte, Ulf Berges, and Carsten Westphal — Experimentelle Physik I, TU Dortmund, Otto-Hahn-Straße 4, 44227 Dortmund, Germany
Due to its outstanding electronic and mechanical properties graphene is highly interesting for many applications, for example as a new material in transistor applications and to build microscale structures.
In this study, the intercalation of gold between graphene and the substrate silicon carbide is investigated. Other investigations have shown, that covalent bounds between the the silicon carbide and the first carbon layer are released by intercalation, which leads to quasi free standing graphene.
To achieve the intercalation, samples have been coated with thin gold-films of different thickness. Subsequently, the samples have been annealed to cause the intercalation. In different steps of the annealing process, photoemission electron microscopy (PEEM) had been carried out for structural and X-ray photoelectron spectroscopy (XPS) for chemical investigation. Furthermore, the intercalation of silver between graphene and silicon carbide has been studied by PEEM.