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Regensburg 2019 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 78: Electronic Structure of Surfaces I: Photoelectron Spectroscopy

O 78.9: Vortrag

Donnerstag, 4. April 2019, 12:45–13:00, H14

Investigating the surface composition of perfluoro-functionalized ionic liquid mixtures by angle-resolved X-ray photoelectron spectroscopy — •Bettina Heller1, Matthias Lexow1, Gabriel Partl2, Hans-Peter Steinrück1, and Florian Maier11Lehrstuhl für Physikalische Chemie II, Friedrich-Alexander-Universität Erlangen-Nürnberg, Erlangen, Germany — 2Institut für Allgemeine, Anorganische und Theoretische Chemie, Leopold-Franzens-Universität Innsbruck, Innsbruck, Austria

Due to their extremely low vapor pressure, ionic liquids (ILs) -salts with a melting point below 100 C per definition- can be investigated under ultra-high vacuum (UHV) conditions with angle-resolved X-ray photoelectron spectroscopy (ARXPS). Using a unique "Dual Analyzer System for Surface Analysis" (DASSA)[1], simultaneous ARXP spectra taken in 0 (bulk sensitive) and 80 (surface sensitive) emission relative to the surface normal provide detailed information about composition and molecular orientation at the sample surface.[2]

In this work, temperature-dependent XPS measurements of IL mixtures consisting of 1-alkyl-3-methylimidazolium hexafluorophosphate [CnC1Im][PF6] and a perfluoro-functionalized IL will be presented, showing a more pronounced surface enrichment of the perfluoro-chain at lower temperature.

[1] I. Niedermaier, C. Kolbeck, H.-P. Steinrück, F. Maier, Rev. Sci. Instrum. 2016, 87, 045105.

[2] H.-P. Steinrück, Phys. Chem. Chem. Phys. 2012, 14, 5010.

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