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A: Fachverband Atomphysik
A 1: Highly charged ions and their applications
A 1.5: Vortrag
Montag, 9. März 2020, 12:15–12:30, a320
Electron-impact single and double ionization of multiply charged xenon ions — •B. Michel Döhring1,2, Benjamin Ebinger1,2, Alexander Borovik Jr1, Kurt Huber1, Fengtao Jin3, Alfred Müller1, and Stefan Schippers1 — 1Justus-Liebig-Universität Gießen — 2GSI Helmholtzzentrum für Schwerionenforschung GmbH, Darmstadt (Germany) — 3Department of Physics, National University of Defense Technology, Changsha (China)
Electron-impact ionization cross sections are important for plasma physics applications, ranging from fusion research through ion thrusters. During recent years a new high-current electron gun [1] has been put into operation at the Giessen electron-ion crossed-beams experiment that extends the range of available electron-ion collision energies from previously 1 keV to now 3.5 keV. Thus, investigations of ions in charge states with ionization thresholds close to or beyond 1 keV are now possible. The present study comprises cross sections for single and double ionization of Xeq+ ions with q=12−14. In addition, we have performed quantum calculations of these cross sections. Our experimental and theoretical results agree well with one another.
[1] B. Ebinger et al., 2017 Nucl. Instrum. Meth. B 408 317.