Hannover 2020 – wissenschaftliches Programm

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A: Fachverband Atomphysik

A 26: Interaction with VUV and X-ray light II

A 26.6: Vortrag

Donnerstag, 12. März 2020, 15:45–16:00, f107

An XUV frequency comb for precision spectroscopy of trapped highly charged ions — •Jan-Hendrik Oelmann, Janko Nauta, Alexander Ackermann, Patrick Knauer, Ronja Pappenberger, Nick Lackmann, Steffen Kühn, Julian Stark, Thomas Pfeifer, and José R. Crespo López-Urrutia — Max-Planck-Institut für Kernphysik, Heidelberg, Germany

In order to perform spectroscopy of highly charged ions in the extreme ultraviolet (XUV) with unprecedented resolution, we have built an XUV frequency comb by transferring a near-infrared frequency comb to the XUV by means of high-harmonic generation [1,2]. To reach the required peak intensity levels at a 100 MHz repetition rate, 200 fs laser pulses are amplified to 80 W in a chirped-pulse fiber amplifier and resonantly overlapped in a femtosecond enhancement cavity [3]. By this means, an average power of 25 kW, corresponding to a peak intensity of ≈ 3·1014 W/cm2, is reached in the cavity focus. High harmonics up to the 35th order are coupled out of the cavity and will be guided to trapped and sympathetically cooled highly charged ions [4] in a superconducting Paul trap to perform direct XUV frequency comb spectroscopy.

[1] C. Gohle et al., Nature 436, 234-237 (2005).

[2] G. Porat et al., Nat. Photon, 12, 387 - 391 (2018).

[3] J. Nauta et al., Nucl. Instrum. Meth. B 408, 285 (2017).

[4] L. Schmöger et al., Science 347, 1233 (2015).

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