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O: Fachverband Oberflächenphysik

O 77: Poster Session VI: Scanning probe techniques: Method development I

Wednesday, March 3, 2021, 13:30–15:30, P

13:30 O 77.1 Identifying the atomic configuration of the tip apex using STM and frequency-modulation AFM with CO on Pt(111) — •Oliver Gretz, Alfred J. Weymouth, and Franz J. Giessibl
13:30 O 77.2 Strumming a Single Chemical Bond — •Alfred J. Weymouth, Elisabeth Riegel, Oliver Gretz, and Franz J. Giessibl
13:30 O 77.3 Bond-Level Imaging of Organic Molecules Using Q-Controlled Amplitude Modulation Atomic Force Microscopy — •Daniel Martin-Jimenez, Alexander Ihle, Sebastian Ahles, Hermann A. Wegner, André Schirmeisen, and Daniel Ebeling
13:30 O 77.4 High-precision atomic force microscopy with atomically-characterized tips — •Alexander Liebig, Angelo Peronio, Daniel Meuer, Alfred J. Weymouth, and Franz J. Giessibl
13:30 O 77.5 Charging single metal nanoparticles grown on thin alumina films by the AFM tipBaptiste Chatelain, •Ali El Barraj, Clemence Badie, Lionel Santinacci, and Clemens Barth
13:30 O 77.6 Ultra-Shallow Dopant Profiles in H:Si(001) as In-Situ Electrodes in Scanning Probe Microscopy — •Alexander Kölker, Takashi Kumagai, Martin Wolf, and Matthias Koch
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