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Regensburg 2022 – scientific programme

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MA: Fachverband Magnetismus

MA 19: Poster 1

MA 19.57: Poster

Tuesday, September 6, 2022, 17:30–20:00, P2

Investigation of the surface structure of Y3Fe5O12 thin films by X-ray photoelectron spectroscopy and diffraction (XPS and XPD) — •Thomas Ruf1, Philip Trempler2, Georg Schmidt2, and Reinhard Denecke11Wilhelm-Ostwald-Institut, Universität Leipzig — 2Institut für Physik, Martin-Luther-Universität Halle-Wittenberg

Y3Fe5O12 (YIG) is a ferrimagnetic and insulating material with low ferromagnetic resonance (FMR) linewidth and damping constant. High surface quality and complete epitaxial growth are important for YIG thin films. High-quality YIG thin films are good candidates for integrated magnonics and spin injection in YIG/metal bilayers.

XPD measurements for assignment of the surface structure of pulsed laser deposited, high quality and pseudomorphic YIG(100) on Gd3Ga5O12(100) and YIG(111) on Gd3Ga5O12(111) 50 nm thin films were conducted. XPS angular intensity anisotropies for high kinetic energy lines Y 3d (Ekin = 1329 eV), Fe 3p (Ekin = 1430 eV) and O 1s (Ekin = 957 eV) of the thin films can be interpreted in the forward focusing regime as a bulk-like (SG Ia3d) surface structure. Simplifying the interpretation to forward focusing allows for interpretation as a real space scan. The normalized intensity for Y 3d and Fe 3p lies in the range of 0.85 to 1.2 and approx. 0.9 to 1.1 for O 1s. This confirms epitaxial coherence reaching to the film surface, as XPD effects are restricted to few atomic layers. The measured XPS quantification ratios of 1.1 and 1.2 for [Y]/[Fe], compared to nominally 0.6, can only be partly explained by those XPS angular intensity anisotropies.

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