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MA: Fachverband Magnetismus

MA 23: Poster Magnetism I

MA 23.35: Poster

Tuesday, March 28, 2023, 17:00–19:00, P1

Switchable magnetic probe for scanning probe microscopy — •Rachappa Ravishankar, Aniruddha Sathyadharma Prasad, Stefan Baunack, Thomas Mühl, Volker Neu, Rudolf Schäfer, and Bernd Büchner — Leibniz Institute for Solid State and Materials Research (IFW) Dresden

Magnetic force microscopy (MFM) has been demonstrated as a valuable technique for the characterization of magnetic nanomaterials. Conventional MFM is a two-pass method, in which the topography of the surface is first obtained by probing the strong Van der Waals and other short-range interactions between probe and sample. During the second scan, the probe is lifted away from the sample, and it experiences long-range magnetic and electrostatic interactions.

A typical approach to disentangle magnetic from non-magnetic signals is by switching the magnetization of the tip in a global external field by means of physically removing the tip from the MFM setup. In the course of our work, we aim at developing an on-chip solution for switching the magnetization of a magnetic probe. We accomplish this by a local Oersted field from a current carrying planar coil, lithographically patterned on either the tip or sample.

This poster highlights switching tip magnetization by a homogeneous field source from a macroscale electromagnetic coil versus an inhomogeneous field from lithographically patterned micro coils on the sample. We showcase this for: (i) commercial MFM probes, and (ii) commercial MFM probes tailored by focused ion beam milling.