Parts | Days | Selection | Search | Updates | Downloads | Help
DS: Fachverband Dünne Schichten
DS 8: Transport Properties
DS 8.2: Talk
Tuesday, March 10, 2026, 14:15–14:30, REC/B214
Correlation of impedance and structural properties in oxides on the microscale — •Jan L. Dornseifer1,2, Christopher P. Körbächer1,2, Martin Becker1,2, Janis K. Eckhardt2, Matthias T. Elm1,2, and Peter J. Klar1,2 — 1Institute of Experimental Physics I, Justus-Liebig-University Giessen, Germany — 2Center for Materials Research (ZfM), Jusuts-Liebig-University Giessen, Germany
The charge transport properties of ionically and/or electronically conducting thin films are governed by their elemental composition and microstructure, including their morphology and grain architecture. Electrochemical impedance spectroscopy (EIS) is widely used to probe the electrical properties, yielding macroscopic parameters. However, linking these to the underlying microscopic transport processes requires theoretical models that have so far failed for samples with expansions comparable to their grain sizes.
Here, we present an experimental approach to directly relate impedance, microstructure and microscopic transport properties. Using cerium oxide and vanadium oxide networks with well-defined microscale transport paths, the impedance of individual networks was measured via microelectrodes. Complementary SEM, EDX, and micro-Raman spectroscopy provided detailed structural information. Correlating these data with the impedance offered new insights into the microstructural influences on the charge transport. This represents a promising way to reliably determine microscopic transport properties of polycrystalline thin films on the microscale.
Keywords: Cerium oxide; Vanadium oxide; Impedance spectroscopy; Microstructure