Dresden 2026 – scientific programme
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HL: Fachverband Halbleiterphysik
HL 20: Poster I
HL 20.17: Poster
Tuesday, March 10, 2026, 18:00–20:00, P1
Universality of Raman spectroscopy for determining twist angle in diverse systems — •Ana Senkić1, Nicolai Leonid Bathen2, Thorsten Deilmann1, Hendrik Lambers1, Lara Blinov1, Aleksandar Matković3, and Ursula Wurstbauer1 — 1Institute of Physics, University of Münster, Münster, Germany — 2Israel Institute of Technology, Haifa, Israel — 3Chair of Physics, Department Physics, Mechanical Engineering, and Electrical Engineering, Montanuniversität Leoben, Leoben, Austria
Twisted bilayers of transition metal dichalcogenides form moiré superlattices, resulting in electronic moiré minibands [1]. Correlated phases hosted in these structures are prone to twist disorder given by lateral fluctuations of the moiré cell size [2]. We investigated this lateral twist inhomogeneity on twisted WSe2 bilayers using comprehensive correlative lateral force microscopy and Raman spectroscopy [3].
In this work, we expand the topic by investigating different twisted systems: artificially stacked fully encapsulated WSe2 bilayers, MoSe2/WSe2 hetero-bilayers and CVD-grown MoS2 bilayers. Moiré phonon frequencies obtained from Raman spectroscopy maps are utilized to determine the twist angle over micrometer-sized areas in these systems. Additionally, Raman mapping facilitates fast and non-destructive identification of homogeneous, high-quality regions in encapsulated and gated structures.
[1] N. Saigal, et. al., Phys. Rev. Lett. 133, 046902 (2024) [2] S. Shabani et al. Nat. Phys. 17, 720-725 (2021) [3] N.L. Bathen et al. in preparation
Keywords: 2D materials; twist angle; Raman spectroscopy; correlated phases; moiré minibands