Dresden 2026 – scientific programme
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HL: Fachverband Halbleiterphysik
HL 8: Ultra-fast Phenomena I
HL 8.5: Talk
Monday, March 9, 2026, 16:00–16:15, POT/0006
Development of an ultrafast scanning electron microscope — •Leon Kroß1, Benjamin Schröder1, Niklas Wemheuer1, Leon Brauns1, Murat Sivis1,2, and Claus Ropers1,2 — 1Max Planck Institute for Multidisciplinary Sciences, Göttingen, Germany — 2University of Göttingen, 4th Physical Institute, Göttingen, Germany
Ultrafast electron microscopy (UEM) enables the study of structural and electronic dynamics in solid-state materials with nanoscale spatial and femtosecond temporal resolution [1]. While UEM at high (> 30 keV) and low (< 1keV) electron energies is well established, ultrafast experiments in the intermediate energy regime have been less employed thus far, despite their potential to bridge the gap between surface- and bulk-sensitive measurements. Here, we present a new ultrafast scanning electron microscope (USEM), designed to investigate physical phenomena in the energy range from 1 to 30 keV. The modular architecture supports diverse experimental configurations and detection schemes, spanning from standard SEM operation modes - such as secondary- and backscattered-electron imaging - to more advanced techniques including cathodoluminescence or electron diffraction. In this contribution, we show example measurements, highlighting the performance of our USEM and its potential for exploring ultrafast physical phenomena. [1] A. Feist et al. Ultramicroscopy, 176, 63-73 (2017)
Keywords: Scanning Electron Microscopy; Instrument development; Pump-probe; Electron pulses