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MA: Fachverband Magnetismus

MA 7: Poster Magnetism I

MA 7.78: Poster

Monday, March 9, 2026, 09:30–12:30, P2

Influence of Reference Sample and Scan Parameters on Magnetic Force Microscopy Calibrations — •Christopher Habenschaden¹, Baha Sakar², Sibylle Sievers¹, and Hans Werner Schumacher¹ — ¹Physikalisch-Technische Bundesanstalt (PTB), 38116 Braunschweig, Germany — ²Felix Bloch Institute for Solid State Physics, University of Leipzig, Linnéstraße 5, 04103 Leipzig

Magnetic force microscopy (MFM) is a technique that enables the precise characterization of magnetic stray field distributions with high sensitivity and spatial resolution. By employing an appropriate calibration procedure, MFM can also provide quantitative values for magnetic fields. This calibration typically involves measuring a reference sample to identify the stray field or stray field gradient of the tip at the sample's surface. This distribution is known as the tip transfer function (TTF), which is obtained through regularized deconvolution in Fourier space. The performance of this process is heavily influenced by the reference sample's properties, scan parameters, and the detection system's noise characteristics, which can restrict its applicability. Our findings indicate that achieving a strong overlap of frequency components between the reference sample and the sample under test is more crucial for accurately reconstructing the stray field than simply obtaining a precise real-space representation of the tip's stray field distribution.

Keywords: MFM; Magnetic Force Microscopy; qMFM; Quantitative Magnetic Force Microscopy; Tip Transfer Function