Dresden 2026 – scientific programme

Parts | Days | Selection | Search | Updates | Downloads | Help

O: Fachverband Oberflächenphysik

O 28: Oxide and insulator surfaces: Structure, epitaxy and growth – Poster

O 28.8: Poster

Monday, March 9, 2026, 18:00–20:00, P2

Local Characterization of Structural and Electronic Properties of the ZnO(0001) Surface — •Yuyang Zhang and Martin Wenderoth — IV Physical Institute, University of Göttingen

Zinc oxide (ZnO) serves as a key model system for understanding Proton-Coupled Electron Transfer (PCET) at interfaces.[1] To unravel electron dynamics on hydrated and doped surfaces, a profound understanding of the pristine surface is the indispensable baseline. Here, high-quality single-crystalline ZnO (0001) surface were prepared under ultra-high vacuum (UHV) conditions. The desired reconstruction was achieved by optimizing cycles of Ar+ sputtering and annealing. The structural properties were characterized by Low-Energy Electron Diffraction (LEED), confirming the long-range order and the intrinsic hexagonal surface symmetry. Similar to [2], Scanning Tunneling Microscopy (STM) revealed an ordered morphology dominated by atomically flat terraces with a high concentration of defects characteristic of polar face. Complementary atomic force microscopy (AFM) measurements provided additional information on the mesoscale morphology. Tunneling current measurements were utilized to probe the local electronic properties, providing insight into the surface band structure. This work was financially supported by the DFG through the CRC1633. [1] Hammes-Schiffer et al, ACS Nano 2017, 11, 10295-10302 [2] Diebold et al, Surf. Sci. 2002, 519, 201-217

Keywords: ZnO; Scanning Tunneling Microscopy; Sample Preparation