Dresden 2026 – scientific programme

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O: Fachverband Oberflächenphysik

O 44: Scanning probe techniques: Method development – Poster

O 44.16: Poster

Tuesday, March 10, 2026, 14:00–16:00, P2

Development of low noise cryogenic circuitry for shot noise measurements in STM — •Anne-Catherine Oeter, Soumyaranjan Jhankar, Christian Ast, and Klaus Kern — Max Planck Institut for Solid State Research

Tunneling currents of electrons are subject to shot noise. Measuring shot noise in a scanning tunneling microscope (STM) can give more insight into the tunneling dynamics and the properties of the tunneling charges. Our goal is to measure shot noise at low tunneling currents simultaneously with the dc tunneling current. To this end, we are developing a low-noise cryogenic pre-amplification circuit. It is made up of a tank oscillator circuit, to filter and amplify the white noise signal at a frequency beyond flicker noise, as well as a HEMT based cryogenic amplification circuit. We will discuss how we want to improve the shot noise circuitry already used in the literature, for example, how to enhance the quality factor of the inductances used to filter the ac signal.

Keywords: STM; noise; circuitry