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O: Fachverband Oberflächenphysik

O 44: Scanning probe techniques: Method development – Poster

O 44.1: Poster

Dienstag, 10. März 2026, 14:00–16:00, P2

Determining the electrical transmission to the junction of a scanning tunneling microscope — •Guido Hiller, Gaël Reecht, and Manuel Gruber — University of Duisburg-Essen

Stochastic resonance spectroscopy has recently been implemented in STM to probe dynamics at the atomic scale over a wide range of timescales, down to the picosecond range [1]. A key requirement for this method is a modulation voltage at the STM junction with an amplitude independent of the frequency. This, in turn, demands an accurate characterization and compensation of the frequency-dependent transmission of the cabling.

Several studies have focused on quantifying such transmissions. In particular, Paul et al. [2] quantitatively analyzed the radio-frequency induced broadening of a sharp feature in dI/dV spectra. Building on this method, we carried out such analysis in the Fourier space and discuss the associated advantages.

[1] Betz et al., arXiv:2412.12647 (2024) / Hänze et al., Sci. Adv. 7, no. 33 (2021) [2] Paul et al., Rev. Sci. Instrum. 87, no. 7 (2016)

Keywords: scanning tunneling microscope; high frequency signal