Dresden 2026 – scientific programme
Parts | Days | Selection | Search | Updates | Downloads | Help
O: Fachverband Oberflächenphysik
O 54: Nanostructured surfaces and thin films
O 54.6: Talk
Wednesday, March 11, 2026, 11:45–12:00, HSZ/0201
Probing Electromagnetic Chirality in Nanoresonators Using Scanning Reflection Anisotropy Microscopy — •Fabian Haake — ETH Zurich, Switzerland
We report on the application of a Scanning Reflection Anisotropy Microscope (SRAM) to study metasurfaces consisting of chiral nanoresonators. SRAM is a polarization-modulated optical method previously applied to strain mapping in crystalline materials and, more recently, demonstrated for amorphous systems (Sendra et al., 2023; APL. 124, 171102, 2024). The structures were fabricated on Si3N4 TEM membranes using electron-beam lithography and metal deposition. Arrays of left- and right-handed resonators were fabricated and probed, showing a wavelength-dependent RAS contrast between the two enantiomorphic forms. Finite-element simulations under circularly polarized illumination reproduce the observed handedness-dependent responses. The results demonstrate that SRAM sensitively resolves enantiomer-specific optical signals at the microscopic scale, enabling direct characterization of electromagnetic chirality in metasurfaces.
Keywords: SRAM; RAS; chiral; metasurface; reflection anisotropy spectroscopy