Dresden 2026 – wissenschaftliches Programm
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QI: Fachverband Quanteninformation
QI 20: Metrology and Sensing
QI 20.8: Vortrag
Freitag, 13. März 2026, 11:45–12:00, BEY/0137
Quantitative inspection of quantum chips using SQUID-on-tip atomic force microscopy — •Daan B. Boltje1, Jessalyn DeVine1, Dalal Benali1, Matthijs Rog2, Tycho Blom2, Milan P. Allan3, Alessandro Bruno4, Kaveh Lahabi1,2, and Johannes Jobst1 — 1QuantaMap B.V., Leiden, The Netherlands. — 2LION, Leiden University, The Netherlands. — 3Faculty of Physics, LMU Munich, Germany. — 4QuantWare B.V., Delft, The Netherlands.
The performance of quantum chips and the physics of quantum materials in general and are often dominated by local properties and or defects. Understanding those local properties requires microscopy that operates at cryogenic temperatures and that does not disturb the highly sensitive quantum effects it aims to reveal. In this talk, we will show measurements obtained with a tuning-fork, atomic force microscope (AFM) that integrates a nano-SQUID sensor on the tip. This design enables extremely short sensor-chip distances and robust height feedback in tapping-mode to prevent crashes, which would damage the SQUID sensor as well as the chip under study. It offers a non-invasive, purely electronic readout and magnetic sensitivity in and out-of plane. Frequency multiplexing permits simultaneous imaging of chip topography, magnetic fields, current flow and thermal dissipation on the nanoscale. We will show experiments from this novel microscope on magnetic and superconducting nanostructures of spin qubits and transmon quantum chips. We demonstrate how insights from this SQUID microscopy into material properties and local effects can be used to improve the quantum chips. [1] M. Rog et al. arXiv:2508.21575 (2025)
Keywords: quantum microscope; SQUID; AFM; quantum chip; diagnostics