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TT: Fachverband Tiefe Temperaturen
TT 74: Topological Insulators
TT 74.8: Vortrag
Donnerstag, 12. März 2026, 11:30–11:45, CHE/0091
Procrustean symmetrization formalism for statistical topological matter — •Johanna Zijderveld1, Adam Yanis Chaou2, Isidora Araya Day1,2,3, and Anton Akhmerov1 — 1Kavli Institute of Nanoscience, Delft University of Technology, Delft, The Netherlands — 2Donostia International Physics Center, San Sebastian, Spain — 3QuTech, Delft University of Technology, Delft, The Netherlands
The standard approach to characterizing topological matter, computing topological invariants, is known to be problematic when the symmetry protecting the topological phase only holds on average in a disordered system. Because of reliance on making the symmetry exact, the topological invariants identify more topological phases than are present in the system. Alternatively, in the recently discovered intrinsic statistical topological insulators [1], making the symmetry exact is guaranteed to destroy the topological phase. We define a procedure of symmetry embedding that solves both problems and provides a unified framework for describing disordered topological matter.
[1] Phys. Rev. Lett. 134, 226601
Keywords: Topological invariants; Statistical topological matter; Topological classification