Erlangen 2026 – scientific programme

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T: Fachverband Teilchenphysik

T 12: Silicon Detectors II

T 12.2: Talk

Monday, March 16, 2026, 16:30–16:45, KH 01.022

Electrical tests for the quality control of ITk Pixel modules — Ruben Förster, Jörn Große-Knetter, •Niklas Grün, and Arnulf Quadt — II. Physikalisches Institut, Georg-August-Universität Göttingen

The Phase-II upgrade of the ATLAS experiment at the LHC includes a complete replacement of the current Inner Detector with the new all-Silicon Inner Tracker (ITk). The ITk is designed to operate at significantly higher luminosities, providing improved granularity, radiation hardness, and tracking performance for the HL-LHC environment. Its construction requires large-scale production, qualification, and integration of highly complex Silicon Strip and Pixel modules across several international sites.

The Pixel Detector modules feature a hybrid module design, meaning that the sensor is read out via frontend readout chips that are bump-bonded to the sensor. To secure high production standards and quality of the ITk Pixel modules, each of the Pixel modules faces multiple electrical QC check-ups between every major production step on top of non-electrical tests and metrology of the components.

In this contribution, work within the ITk Pixel module production chain is presented as carried out in Göttingen, which is one of the sites of the German production cluster. A focus will be placed on ensuring production quality, improving data-driven validation procedures, and contributing to the smooth operation of the module production workflow. In particular the electrical tests for the quality control of ITk Pixel modules are spotlighted.

Keywords: ATLAS; ITK; Silicon Pixel Sensors; Electrical quality control