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T: Fachverband Teilchenphysik

T 55: Silicon Detectors VI

T 55.7: Talk

Wednesday, March 18, 2026, 17:45–18:00, KH 01.022

Wafer-level quality control procedure of silicon pixel sensors for the LHCb U2 Mighty-Tracker — Johannes Albrecht, •Jonas Rönsch, Dirk Wiedner, and Lukas Witola — TU Dortmund University, Dortmund, Germany

To exploit the full flavour physics potential of the HL-LHC after long shutdown 4 (2034-2036), the LHCb detector will be operated at an instantaneous luminosity of 1.0×10³⁴cm⁻²s⁻¹. Due to the higher particle density, an upgrade is necessary to increase the granularity of the tracking system. The main tracking stations will be replaced by the Mighty-Tracker. It combines roughly 285 m² of scintillating fibres in the outer region and 8 m² of high voltage monolithic active pixel sensors (HVMAPS) called MightyPix in the inner region.
The pixel detector will be instrumented with approximately 46000 sensors, which all need to be thoroughly tested before being assembled into modules. Due to the large quantity the tests will be performed on a semi-automatic probe station.
The wafer-level quality control procedure of the MightyPix will be presented in this talk.

Keywords: LHCb; Mighty-Tracker