Erlangen 2026 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
T: Fachverband Teilchenphysik
T 97: Silicon Detectors VIII
T 97.1: Vortrag
Freitag, 20. März 2026, 09:00–09:15, KH 01.022
MIP detection on a plastic scintillator and SiPM system in very noisy environments — •Katjana Neumann, Massimiliano Antonello, Lukas Brinkmann, Erika Garutti, and Jörn Schwandt — Universität Hamburg, Hamburg, Deutschland
Radiation damage to a silicon photomultiplier (SiPM), as occurs during the lifetime of the planned CMS HGCAL detector, increases the dark current and degrades the signal to noise (S/N) separation and thus the minimum ionizing particles (MIP) detection efficiency. To investigate this, a system consisting of a plastic scintillator tile directly coupled to a SiPM is used to detect the MIP from a 90Sr source. The aim of this thesis was to compare the effects of true radiation-induced damage with a method that increases the dark-count rate (DCR) exclusively through DC light illumination. This second approach does not induce any physical structural damage. This allows the isolation of the effect of increased DCR as the primary factor degrading the SiPM response. The results show that an increase in the DCR, regardless of whether it was induced by irradiation or DC illumination, leads to a comparable reduction in the MIP-response and the S/N ratio. This confirms that the dominant factor for the performance degradation is the increased DCR itself and not additional damage or defects introduced in the silicon. This study highlights a significant insight: the primary consequence of radiation damage on SiPMs can be effectively mimicked under laboratory settings using optical illumination to increase the DCR.
Keywords: Silicon Photomultiplier; Light yield