Mainz 2026 – scientific programme
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Q: Fachverband Quantenoptik und Photonik
Q 11: QuanTour I – Single Photons & Foundations
Q 11.3: Invited Talk
Monday, March 2, 2026, 17:30–18:00, P 7
Quantum radiometry metrology for quantum photonics technologies — •Angela Gamouras1, Malcolm White2, Nathan Tomlin3, Michelle Stephens3, John Lehman3, Philip Poole1, Dan Dalacu1, and Robin Williams1 — 1National Research Council Canada, Ottawa, Canada — 2University of Colorado Boulder, Boulder, USA — 3National Institute of Standards and Technology, Boulder, USA
Quantum photonics technologies are transitioning from research prototypes to widely adopted tools in laboratories and industry. Quantum photonic integrated circuits - devices that combine single-photon sources, detectors, and other components on a single chip - are now integral to quantum networking and computing hardware. Accurate characterization of single-photon sources and single-photon detector efficiencies are essential for verifying and validating system performance. However, these measurements remain a persistent challenge. Current characterization methods typically rely on standard optical power meters and attenuated laser sources to calibrate detector efficiency. In this presentation, we introduce quantum radiometry techniques designed to meet the demands of quantum photonics systems. We describe an ultra sensitive radiometer chip capable of measuring the optical power emitted by a quantum dot single-photon source. This approach enables direct source characterization, which can be extended to assess on chip components. Our measurement technique shows the feasibility of implementing optical power metrology for quantum dot emitters, enabling the validation and testing of quantum photonic technologies.
Keywords: Quantum radiometry; Quantum dot; Quantum photonics metrology; Absolute radiometer chip detector