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Q: Fachverband Quantenoptik und Photonik

Q 34: Quantum Technologies – Sensing I

Q 34.2: Vortrag

Mittwoch, 4. März 2026, 15:00–15:15, P 5

Quantum limits of photon-induced near-field electron microscopy — •Hao Jeng — Department of Ultrafast Dynamics, Max Planck Institute for Multidisciplinary Sciences, Göttingen D-37077, Germany — IV. Physical Institute, University of Göttingen, Göttingen D-37077, Germany

The principles of quantum metrology imply that the sensitivity of current electron microscopes can be improved substantially. An increase in sensitivity would effectively reduce the number of electrons needed, which is crucial for electron microscopes because many specimens are too fragile to survive the constant bombardment by swift electrons. In this contribution, we analyse the fundamental quantum limits for a particular type of electron microscopy known as ``photon-induced near-field electron microscopy". We derive bounds on the quantum Fisher information of the system, identify probes that attain these bounds, and find ways to surpass the limits of our instrument using non-classical states of electrons and light.

Keywords: quantum metrology; quantum imaging; quantum fisher information; electron microscopy; photon-induced near-field electron microscopy