Münster 1997 – wissenschaftliches Programm

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O: Oberflächenphysik

O 20: Optische Nahfeld-Mikroskopie

O 20.4: Vortrag

Dienstag, 18. März 1997, 16:45–17:00, BOT

Preparation of Near-Field Optical Probes — •H. Gao and U. Hartmann — FR Experimentalphysik, Universität des Saarlandes, D-66041 Saarbrücken

The quality of probes in scanning near-field optical microscopy is highly important, because it governs two crucial aspects of near-field imaging: lateral resolution and transmission efficiency. The preparation of these probes is divided into two separate steps, which are both of same importance. First, a glass-fiber has to be chemically etched in HF to prepare a glass fiber-tip. The curvature of the tip should be less than 100 nm. Second, the fiber tips are coated with an aluminum film in a UHV chamber. The thickness of the films varies between 100 and 200 nm. The aperture of the fiber tips, which is limited by the metallic coating of the fibers, should be less than 50 nm. The quality of the manufactured fibers is discussed with respect to scanning near-field optical data on various samples.