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HK: Hadronen und Kerne
HK 56: Postersitzung
HK 56.83: Poster
Wednesday, March 18, 1998, 17:00–19:00, Foyer
Submicron Focusing of High Energy Ions — •G. Datzmann, G. Dollinger, C. Goeden, O. Schmelmer, and H.-J. Körner —
Physik-Department E12, TU-München, 85748 Garching
A new nanoprobe will be installed at the Munich Tandem accelerator [1], which aims to investigate special topics concerning solid state physics, biology and medicine. Focusing 25 MeV protons and heavy ions up to 200 MeV q2/A to a beam diameter of 100 nm at the focal plane, standard lens and slit equipment is no longer applicable. Therefore these components have been developed especially for this project. The ionoptical system consists of two stages with a total demagnification factor 200. The second stage of this system is a superconducting quadrupole doublet lens, with overlayed 2n-poles (n = 4,6,8). The multipole components of this lens have been determined by a ray tracing program including fringing field calculations in order to minimize spherical aberrations. In addition new precision object and divergence slits have been designed. The choice of material and geometry results in a reduced halo from slit scattering effects. Finally a new type of H−-ionsource is under development, which uses electronically stimulated H− desorption from surfaces. It is proposed, that such type of ion source should deliver a much more brilliant beam than standard plasma sources.
[1] G. Dollinger et al., NIM B, 130 (1997) 51