Regensburg 1998 – wissenschaftliches Programm
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TT: Tiefe Temperaturen
TT 15: Postersitzung II: Massive HTSL (1-12), Supraleitung: Anwendungen (13-34), Josephsonkontakte und Kryoelektronik (35-75), Elektronenstruktur und Phononen in HTSL (76-79), Schwere Fermionen, Kondo-Systeme (80-99)
TT 15.60: Poster
Mittwoch, 25. März 1998, 15:00–18:30, D
c-Axis current-voltage characteristic and critical current statistics of intrinsic Josephson junctions in Bi2SrCa2Cu2O8+x single crystals. — •M. Fistul, G. Logvenov, and P. Müller — Physikalisches Institut III, Universität Erlangen- Nürnberg, D-91058 Erlangen, Germany
We present experimental and theoretical study of c-axis current-voltage characteristics (CVC) in small Bi2Sr2CaCu2O8+δ single crystals. We have used a model of a stack of intrinsic Josephson junctions in which the critical current between adjacent layers is a random function with a probability distribution P(Jc). A simple RSJ model and a corresponding CVC for each of the single junctions have been assumed. Making use of the observed CVCs we have obtained critical current statistics for different values of temperature and external magnetic field. We have shown that the penetration of an external magnetic field in the form of randomly distributed pancake vortices leads to a broadened probability distribution P(Jc) given by : P(Jc) = Jc/J02 exp(−Jc2/J02), where J0 is an average critical current density of the stack of intrinsic Josephson junctions.