Leipzig 1999 – scientific programme
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PO: Polymerphysik
PO 6: Poster: Dünne Filme und Grenzfl
ächen
PO 6.2: Poster
Tuesday, March 2, 1999, 14:00–16:00, Foyer
Dependence of thin film morphology on blend compatibility — •J. S. Gutmann1,2, P. Müller-Buschbaum1, D. W. Schubert3, N. Stribeck2, and M. Stamm1 — 1MPI für Polymerforschung — 2Institut TMC, Universität Hamburg — 3GKSS Forschungszentrum
The creation of surface structures from polymer blends has been the focus of many investigations in the last years, and has so far been addressed for a variety of mostly incompatible blends.
With the stat-poly-styrene-co-para-bromo-styrene (PBrxS) blend system (Mw = 240k - 390k), we have studied the influence of the blend compatibility on resulting morphologies. For different compatibilities we examined blends of different compositions prepared on silicon wafers. By a variation of the difference in the degree of bromination of the blended polymers we are able to fine tune the compatibility of the individual blends without a change in the nature of the interparticle interactions. It is therefore possible to gain a direct insight on the impact of the blend compatibility on the blend morphology.
The resulting topologies were probed with scanning probe microscopy. These SPM results are compared to specular and diffuse reflectivity experiments, yielding information about phase separation within the blend film.