Regensburg 2000 – wissenschaftliches Programm
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O: Oberflächenphysik
O 11: Postersession (Eröffnung)
O 11.95: Poster
Montag, 27. März 2000, 19:00–22:00, Bereich C
Phase separation and dewetting of thin polymer blend films — •P. Müller-Buschbaum1, J. S. Gutmann2, M. Stamm3 und W. Petry1 — 1TU München Physik Department LS E13, James-Franck-Str.1, 85747 Garching — 2MPI für Polymerforschung, Ackermannweg 10, D-55128 Mainz — 3IPF Dresden, Hohe Str. 6, 01069 Dresden
The morphology of dewetted thin polymer blend films of deuterated polystyrene (dPS) and polyparamethylstyrene (PpMS) on top of silicon surfaces is investigated. Phase separation and dewetting result from the storage of the samples under toluene vapor atmosphere. Atomic force microscopy (AFM) and grazing incidence small angle scattering (GISAS) are used. From the differences in the GISAS data measured with x-rays compared to data measured with neutrons a random distribution of the molecules inside the individual droplets is determined. All methods show a similar most prominent in-plane length, which corresponds to the mean droplet distance. Its function of film thickness is explainable by the spinodal dewetting model [1].
[1] P. Müller-Buschbaum, J. S. Gutmann, M. Stamm, R.Cubitt, S.Cunis, G.von Krosigk, R.Gehrke, W.Petry; to be published