Regensburg 2000 – scientific programme

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SYNA: Carbon Nanotubes

SYNA 2: Poster

SYNA 2.1: Poster

Thursday, March 30, 2000, 13:30–16:00, A

Electronic Characterisation of Carbon Nanotubes by Scanning Probe Microscopy — •Mihail Croitoru¹, Fangxing Zha², Wilfried Clauss¹ und Dieter P. Kern¹ — ¹Auf der Morgenstelle 10, 72074 Tuebingen — ²MPI f. Festkörperphysik, Heisenbergstr. 1, 70569 Stuttgart

Single-wall carbon nanotubes deposited on various substrates were imaged with scanning tunneling and scanning force microscopy. A newly developed combination of tunneling and force microscopy enables near-atomic point resolution in the force signal, and tubes can be identified without the need of a conducting substrate. This is a crucial step for the characterization of electronic devices based on individual single-wall tubes. First examples of electrically active tubes on insulating substrates imaged by this technique will be presented.
As a further step, the microscope tip can be used for fabrication of ohmic contacts between tubes and the substrate contacts by a local, field-driven deposition method.