Hamburg 2001 – wissenschaftliches Programm
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O: Oberflächenphysik
O 13: Postersitzung (Adsorption auf Oberfl
ächen, Oberfl
ächenreaktionen, Elektronische Struktur, Epitaxie und Wachstum, Halbleiteroberfl
ächen und Grenzfl
ächen, Oxide und Isolatoren)
O 13.44: Poster
Montag, 26. März 2001, 19:00–22:00, Foyer zu B
High-resolution Fermi surface maps by an alternative manipulator system on the example of quasi-twodimensional TiTe2 — •B. Eltner, G. Nicolay, S. Schmidt, D. Ehm, F. Reinert, and S. Hüfner — Universität des Saarlandes, Postfach 151150, D-66041 Saarbrücken
In the last ten years[1], the method of FSM (Fermi Surface Mapping), that takes advantage of angle-resolved photoemission spectroscopy (ARUPS), has become an established instrument for the determination of 2- and 3-dimensional Fermi surfaces in metals, beyond the restrictions, that result from the use of quantum oscillating methods. To map the Fermi surface (FS), it is necessary to reach the photoelectron emission angles of the complete half space above the sample surface, what has been done so far by rotating the sample in azimuthal and polar angle, while keeping photon source and analyser fixed[2]. We present an alternative method of angle variation by tilting the sample (kept in the center of rotational axes) perpendicular to the plane of incidence , set by the directions of incoming radiation and analyser, to scan step-by-step the polar angle and parallel to this plane to do so on the azimuthal angle. This method offers a) a better use of the parallel detection mode on SCIENTA SES 200 and b) an easier coupling of the sample to the cryostat. We demonstrate the characteristics of this setup on the example of the layer-system TiTe2.
[1] A.Santoni, L.J.Terminello, F.J.Himpsel, T.Takahashi, Appl.Phys. A52, 229 (1991)
[2] J.Osterwalder, T.Greber, A.Stuck, L.Schlapbach, PRB 44, 13764 (1991)