Hamburg 2001 – wissenschaftliches Programm

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SYOF: Organische Festkörper

SYOF 2: Surfaces and Interfaces

SYOF 2.7: Vortrag

Dienstag, 27. März 2001, 13:05–13:20, S6

Order on disorder: Comparison of copper phthalocyanine thin films on technical substrates and on single crystals — •Heiko Peisert, Torsten Schwieger, Jutta M. Auerhammer, Martin Knupfer, Mark S. Golden, and Jörg Fink — Institute for Solid State Research, IFW Dresden, P.O. Box 270016, D-01171 Dresden, Germany

We have studied the molecular orientation of the commonly used organic semiconductor copper phthalocyanine (CuPC) grown as thin films on the technically relevant substrates ITO, oxidised Si and polycrystalline gold using polarisation-dependent x-ray absorption spectroscopy, and compare the results with those obtained from single crystalline substrates [Au(110) and GeS(001)]. The 20-50 nm thick CuPC films on the technical substrates are as highly ordered as on the single crystals. However, the molecular orientation in the two cases is radically different: the CuPC molecules stand on the technical substrates and lie on the single crystalline substrates. The influences on both the organic/inorganic interface properties and the transport properties in devices are discussed.