Hamburg 2001 – wissenschaftliches Programm
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SYOF: Organische Festkörper
SYOF 5: Poster Session
SYOF 5.41: Poster
Dienstag, 27. März 2001, 17:00–19:00, Aula S3
Scanning Electroluminescence Microscopy (SELM) on OLEDs — •Helmut Hänsel1, Heiko Zettl1, Armin Knoll1, Georg Krausch1, Stefan Berlep2, Anton Mückl2, and Wolfgang Brütting2 — 1Universität Bayreuth, Physikalische Chemie II — 2Universität Bayreuth, Experimentalphysik II, D-95447 Bayreuth
A new method for local investigation of charge transport and electroluminescence in OLEDs has been developed. We modified a Scanning Near-field Optical Microscope such, that a Platinum-Iridium tip could be used as scanning probe similar to conventional STM. To provide additional information on the topography we use shear force detection. /par Measurements are presented for Alq3-films on ITO, that together with the scanning probe tip form a single layer OLED device. In order to decrease mechanical and electrochemical damage of the sample we scan the distance of the tip at each point while detecting shear force, current and electroluminescence. We find that electroluminescence typically starts when the tip is indented several nanometers into the sample and increases with further indentation. Strong local variations are observed.