Regensburg 2002 – wissenschaftliches Programm

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SYME: Mechanical Properties of Thin Films

SYME 2: Nanoindentation

SYME 2.2: Vortrag

Dienstag, 12. März 2002, 09:45–10:00, H 4

Dynamic mechanical characterization of very soft polymeric materials using nanoindentation technique — •Nicolas Conte and Vincent Jardret — MTS Systems Corporation, 1001 Larson Drive, Oak Ridge, TN 37830, USA

Polymer thin films and surfaces play a major role in the functionality of many components in the microelectronic and automotive industries. The characterization of their mechanical properties at a nanometer scale remains a technological challenge. Instrumented indentation testing with frequency-specific dynamic analysis provides access to viscoelastic measurement of near surface properties of polymeric materials. The development of specific testing methodologies with improved accuracy and precision for evaluating very soft polymeric materials are presented in this work. Results of viscoelastic properties at various frequencies for polyurethane and polydimethylsilane using both Berkovich and Flat punch geometries are compared.