Regensburg 2002 – wissenschaftliches Programm

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SYOH: Organische Halbleiter

SYOH 7: Poster

SYOH 7.7: Poster

Montag, 11. März 2002, 18:00–21:00, C

FTIRRAS-study on the growth properties of thin organic films: NTCDA on Ag(111) — •V. Shklover, D. Hübner, R. Fink, Th. Schmidt, and E. Umbach — Experimentelle Physik II, Universität Würzburg, Am Hubland, 97074 Würzburg

For the model system NTCDA on Ag(111) the different growth regimes in thin organic films have been investigated by Fourier Transform Infrared Reflection Absorption Spectroscopy (FTIRRAS) as a function of various preparation parameters, i.e., film thickness, deposition rate, substrate temperature and annealing temperature. The comparison of the observed features and changes in the IR-spectra with LEED, NEXAFS and XPEEM data result in a detailed model for the film growth near thermodynamical equilibrium. Film growth above room temperature leads to Stranski-Krastanov growth with different film morphologies, whereas at low-temperature deposition the film growth is rather of layer-by-layer (Frank van der Merwe) type. The identification of the vibrational modes is based on quantum chemical DFT calculations. (Financially supported by the BMBF, contract 05 KS1 WWA 5).