Regensburg 2002 – wissenschaftliches Programm
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SYPF: Struktur und Dynamik in dünnen Polymerfilmen
SYPF 2: Poster Session
SYPF 2.1: Poster
Donnerstag, 14. März 2002, 09:00–18:00, Poster B
X-Ray Reflectivity Study on the Surface and Bulk Glass Transition of Polystyrene — •Ingo Grotkopp1, Rüdiger Weber1, Jochim Stettner1, Werner Press1, Metin Tolan2, and Oliver Seeck3 — 1Institut für Experimentelle und Angewandte Physik, Christian-Albrechts-Universität, Leibnizstraße 19, 24098 Kiel, Germany — 2Experimentelle Physik I, Universität Dortmund, 44221 Dortmund, Germany — 3IFF, FZ Jülich GmbH, 52425 Jülich
On polystyrene (PS) films, decorated with gold clusters on a nanometer scale, an investigation has been performed using x-ray reflectivity measurements. During these experiments the samples were annealed above the glass transition temperature Tg and the behavior of the clusters was observed by analyzing the specularly reflected intensity with the method from Parratt[1] and an inversion algorithm[2]. Furthermore the data from the diffusely scattered intensity was treated within the kinematical approximation.
In this way the clusters could be used as a probe for the glass transition in the near surface region of the PS films while the thermal expansion of the entire film was simultaneously monitored in order to determine the bulk value of Tg.
[1] L. G. Parratt, Phys. Rev. 95, 359 (1954)
[2] K.-M. Zimmermann et al., Phys. Rev. B 62 10377 (2000)