Regensburg 2002 – wissenschaftliches Programm
SYPF 2.23: Poster
Donnerstag, 14. März 2002, 09:00–18:00, Poster B
Argon Ion-Beam Surface Modification of Polystyrene — •Jurgita Zekonyte, Jörn Erichsen, Vladimir Zaporojtchenko, and Franz Faupel — Technische Fakultät, Lehrstuhl für Materialverbunde, Kaiserstr. 2, 24143 Kiel
The surface sensitive techniques such as x-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM) and contact angle measurements were used to study the changes in the polystyrene (PS) surface glass transition temperature Tg, metal adsorption probability, surface energy and morphology after Ar+ ion treatment with low fluencies of 1013 to 1016 cm−2. The ion bombardment leads to the PS ablation due to the breaking of the bonds in the polymer molecular chains. The ablation rate showed an increase with the ion energy of 0.5 to 5 keV. The enhancement in the polymer surface glass transition temperature, condensation coefficient, and surface energy was observed. The changes are discussed in terms of ion beam induced cross-linking, defects, and an increase in surface roughness.