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Dresden 2003 – scientific programme

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DY: Dynamik und Statistische Physik

DY 25: Growth processes and interface features I

DY 25.1: Talk

Tuesday, March 25, 2003, 15:00–15:15, G\"OR/229

Interfacial melting of ice in contact with SiO2 — •Simon Engemann1, Harald Reichert1, Helmut Dosch1, and Jörg Bilgram21MPI für Metallforschung, Heisenbergstr. 3, D-70569 Stuttgart — 2Laboratorium für Festkörperphysik, ETH, CH-8093 Zürich

The melting behaviour of ice in contact with rock and other materials has a crucial impact onto many phenomena in nature and everyday life, as for glaciers, permafrost and for friction. A hitherto unsolved problem is whether or not ice in contact with minerals shows interfacial premelting. Experimental evidence has been inconclusive so far, mainly due to the difficulties in probing deeply buried interfaces. We have performed insitu reflectivity measurements using 70 keV-high energy x-ray microbeams to study the SiO2-ice interface. The experiments give for the first time clear evidence for the formation of a (quasi)liquid layer between SiO2 and ice upon approaching the melting point. In comparison to the premelting at the free surface of ice the parameters of the growth law for the interface layer are significantly altered.

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