Dresden 2003 – wissenschaftliches Programm
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HL: Halbleiterphysik
HL 14: Poster I
HL 14.47: Poster
Montag, 24. März 2003, 17:00–19:30, HSZ/P2
Ellipsometric characterisation of phthalocyanine thin films — •O.D. Gordan, M. Friedrich, O. Sychugova, and D.R.T. Zahn — Institut für Physik, Technische Universität Chemnitz, D-09107 Chemnitz, Germany
Phthalocyanines (Pc) are well known and significantly studied, but still there is little information on the dielectric function of such materials. In this paper we present the optical constants for H2Pc films, obtained from simulation of ellipsometry spectra using both isotropic and anisotropic model approaches. Thin films of metal - free phthalocyanine (H2Pc) were grown by organic molecular beam deposition (OMBD) in high vacuum. The substrates (H2 passivated Si (111), NaCl and glass) were kept at the room temperature during the deposition. From the absorption spectra in the visible and ultraviolet region the films are found to be crystalline with α - phase dominating. Ellipsometric measurements were performed using a variable angle spectroscopic ellipsometer, in the spectral range of 0.7 - 4.5 eV with a 0.02 eV step, at multiple angles of incidence. In order to obtain the optical constants, fits were performed using Wvase software. In addition calculated ellipsometry data are compared to the results of absorption measurements. Absorption spectra in the infrared were obtained in order to determine ordering of the molecular planes with respect to the substrate plane.