Dresden 2003 – scientific programme

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O: Oberflächenphysik

O 12: Postersitzung (Struktur und Dynamik reiner Oberfl
ächen, Grenzfl
äche fest-flüssig, Nanostrukturen, Teilchen und Cluster, Halbleiteroberfl
ächen und Grenzfl
ächen, Zeitaufgelöste Spektroskopie, Rastersondentechniken, Methodisches)

O 12.11: Poster

Monday, March 24, 2003, 18:00–21:00, P1

X-ray reflectivity of ultra thin liquid films — •Robert Fendt¹, Christian Gutt¹, Michael Sprung¹, Tuana Ghaderi¹, Metin Tolan¹, and Oliver Seeck² — ¹Experimentelle Physik I, Universitaet Dortmund — ²Hasylab, Hamburg

The dynamic and structural properties of confined liquids may differ significantly from the corresponding bulk values. We investigated the structure of ultra thin liquid films with thickness of 2 - 10 nm by means of X-ray reflectivity. With the aim to study (i) the liquid-solid interface and (ii) the influence of substrate-adsorbate interactioncapillary on the capillary wave spectrum of thin liquid films. For this purpose a high vacuum sample cell has been designed in which substrates like e.g. glass or MgF2-single-crystals can be covered by a thin liquid film via gas adsorption. In order to achieve stable films on the substrate the temperature stability has to be around 5 mK. X-ray reflectivity measurements have been performed at the W1 diffractometer at Hasylab, Hamburg.