DS 14: Schichtwachstum
  Mittwoch, 10. März 2004, 14:30–16:15, HS 32
  
    
  
  
    
      
        
          
            
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          14:30 | 
          DS 14.1 | 
          
            
            
              
                Microstructure of polymer-metal composite thin films grown by pulsed laser deposition — •Jörg Faupel, Thorsten Scharf, and Hans-Ulrich Krebs
              
            
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          14:45 | 
          DS 14.2 | 
          
            
            
              
                In-situ x-ray diffraction during sputtering of Shape Memory Alloy (SMA) Ni-Ti thin films — •R.M.S. Martins, N. Schell, F.M.B. Fernandes, and R. Silva
              
            
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          15:00 | 
          DS 14.3 | 
          
            
            
              
                Early Stages of Self-assembled Nanostructure Formation during Cu Deposition onto VSe2 Crystals — •S. Hollensteiner, E. Spiecker, W. Jäger, H. Haselier, and H. Schroeder
              
            
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          15:15 | 
          DS 14.4 | 
          
            
            
              
                Non-linear effects in the Monte Carlo simulation of sputter-induced surface morphology — •Oluwole E. Yewande, Alexander K. Hartmann, and Reiner Kree
              
            
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          15:30 | 
          DS 14.5 | 
          
            
            
              
                Structural evolution in chromium nitride thin films: A comparison with structure-zone models — •Yvonne Gerbig, Corinne Nouveau, and Henry Haefke
              
            
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          15:45 | 
          DS 14.6 | 
          
            
            
              
                Control of surface roughness in amorphous thin film growth — •Frank Elsholz, Eckehard Schöll, Hans Eichler, Chris Scharfenorth, and Arkadi Rosenfeld
              
            
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          16:00 | 
          DS 14.7 | 
          
            
            
              
                Porous Thin Films Grown by Size-Selected Si-Nanoparticles — •Felix Voigt, Rudolf Brüggemann, Friedrich Huisken und Gottfried H. Bauer
              
            
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