Regensburg 2004 – wissenschaftliches Programm

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DS: Dünne Schichten

DS 7: Spezielle Schichten III

DS 7.4: Vortrag

Montag, 8. März 2004, 12:15–12:30, HS 32

AFM investigation of oligophenyl thin films on crystalline substrates — •G. Hlawacek¹, C. Teichert¹, S. Müllegger², A. Winkler², R. Resel², S. Berkebile³, and M. Ramsey³ — ¹Department of Physics, University of Leoben, A-8700 Leoben, Austria — ²Department of Solid State Physics, Graz Technical University, A-8010 Graz, Austria — ³Department of Experimental Physics, University of Graz, A-8010 Graz, Austria

Crystalline films of conjugated organic semiconductors as para-sexiphenyl (PSP, C₃₆H₂₆) and para-quaterphenyl (PQP, C₂₄H₁₈) offer attractive potential for optoelectronic applications. Here, Atomic Force Microscopy (AFM) is used to investigate the nanometer-scale morphology of PQP on various gold substrates and PSP on TiO₂(110).

These oligophenylens can form complex arrays of three-dimensional crystallites, where the long axis of the molecules are nearly parallel to the surface. The orientation of these arrays is controlled by the geometry of the substrate surface. On polycrystalline gold and TiO₂(110) we could also observe terrace structures composed of upright standing molecules. Growth hillocks – consisting of several such layers – and crystallites coexist within close proximity.