Regensburg 2004 – wissenschaftliches Programm
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DY: Dynamik und Statistische Physik
DY 46: Poster
DY 46.40: Poster
Donnerstag, 11. März 2004, 16:00–18:00, Poster D
Distribution of reflection coefficients for microwave cavities in dependence of coupling and absorption strength — •U. Kuhl1, H.-J. Stöckmann1, R. A. Méndez-Sánchez2, and C. H. Lewenkopf3 — 1Fachbereich Physik, Philipps-Universität Marburg, Renthof 5, D-35032 Marburg, Germany — 2Centro de Ciencias Físicas UNAM, A.P 48-3, 62210, Cuernavaca, Morelos, México — 3Instituto de Física, UERJ, R. São Francisco Xavier 524, 20550-900 Rio de Janeiro, Brazil
The reflection spectra of rectangular microwave cavities, with a half circular inset attached to one of the walls, have been measured in dependence of the position of the inset. To cover the range from weak up to strong absorption, for part of the measurements one wall was coated with a layer of absorbing material. The distribution of reflection coefficients was investigated in dependence of the antenna coupling strength and the absorption within the cavities. The results are in good agreement with numerical calculations, as well as with the theoretical predictions for the limiting case of strong absorption [1]. In spite of the fact that the system is time-reversal invariant, it is found that Gaussian unitary ensemble calculations can be used to describe the results, if only the coupling parameter is rescaled by a factor of two [2].
[1] E. Kogan, P.A. Mello, and H. Liqun, Phys. Rev. E 61, R17 (2000).
[2] D.V. Savin and H.-J. Sommers, Phys. Rev. E 68, 036211 (2003).