Regensburg 2004 – wissenschaftliches Programm
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DY: Dynamik und Statistische Physik
DY 46: Poster
DY 46.68: Poster
Donnerstag, 11. März 2004, 16:00–18:00, Poster D
Kinetic roughening of laser deposited polymer films: Crossover from single particle to continuous growth — •Jörg Hachenberg1, Christoph Streng1, Erik Süske2, Sebastian Vauth1, Stefan G. Mayr1, Hans-Ulrich Krebs2, and Konrad Samwer1 — 1I. Physikalisches Institut, Universität Göttingen — 2Institut für Materialphysik, Universität Göttingen, Tammannstr. 1, 37077 Göttingen
Thin film samples are prepared by pulsed laser deposition (PLD) of Bisphenol-A (BPA) polycarbonate targets at room temperature and under UHV conditions. Atomic force microscopy (AFM) is used to investigate the development of the surface roughness as a function of the thickness and the deposition angle.
We find that the roughness increases proportional to the film thickness by the growth exponent of 1/4 between 20nm and more than 4 µ m . This is interpreted within computer simulations and theoretical models. Similar results have been shown in amorphous metallic systems, but on different scales. For lower film thicknesses than 20nm we observed a crossover to even steeper slopes where the particle character dominates the roughening and a continuous description is no longer valid. Additional investigations under variation of the laser fluency have been performed.
This project is supported by the DFG, SFB 602, TP B3 and GRK 782.