Regensburg 2004 – wissenschaftliches Programm
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HL: Halbleiterphysik
HL 44: Poster II
HL 44.75: Poster
Donnerstag, 11. März 2004, 16:30–19:00, Poster A
Investigations of the local and temporal temperature changes in precision shunt resistors — •G. Klinger1, V. Schlosser2, G. Heine3, W. Waldmann3, and M. Garcocz3 — 1Institut für Meteorologie und Geophysik, Universität Wien — 2Institut für Materialphysik, Universität Wien — 3Bundesamt für Eich- und Vermessungswesen, Wien
The most accurate determination of alternating electrical currents or voltages is based on a comparison with direct current measurements which can be resolved with a far higher precision. A widely used method is the conversion of the electric power to heat in a thermal converter. Because the range of thermal converters is restricted to currents below 15 mA and voltages of less than 3 V higher currents and voltages are measured by a step-up transformation. In the case of high currents precision shunt resistors are used. The knowledge of the temporal and spatial temperature distribution of the resistor during operation is an essential prerequisite to (i) perform an error correction and to (ii) optimize the design of the resistor. In the present work we used a thermo camera to investigate the temperature distribution of shunt resistors. Additional measurements with thermo couples were carried out in order to correct measurement deviations caused by optical surface properties. The results of the measurements and model calculations of the resistor’s temperature dependence will be discussed.