Regensburg 2004 – wissenschaftliches Programm
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MA: Magnetismus
MA 2: Mikromagnetismus / Computational Magnetism
MA 2.2: Vortrag
Montag, 8. März 2004, 10:30–10:45, H10
Measurement and simulation of domains in permalloy microstructures — •Markus Bolte, Miriam Barthelmeß, Christian Pels, Alexander Thieme, and Gu ido Meier — Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Jungiusstraße 11, 20355 Hamburg
We have measured the stray fields of thin permalloy (Ni83Fe17) microstructures with different geometries in the range of 1×1 µ m2 to 4×4 µ m2 and ten different thicknesses between 10 nm and 100 nm by magnetic-force microscopy (MFM). The MFM images are compared to corresponding images calculated from micromagnetic simulations. For the present calculations, the MFM tip is considered a magnetic point dipole. To describe the real thin film tip within the framework of this approximation, the dipole moment must be located at an elevated position within the tip volume [2]. In particular, the type of 180∘ domain walls is well described by the model. We observe a transition from cross-tie to asymmetric Bloch walls between 70 nm and 100 nm film thickness in good agreement with simulation.
[1] M. Barthelmess, C. Pels, A. Thieme, and G. Meier, submitted 2003.
[2] J. Lohau, S. Kirsch, A. Carl, G. Dumpich, and E. F. Wassermann, J. Appl. Phys. 86, 3410 (1999).