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MA: Magnetismus
MA 4: Oberfl
ächenmagnetismus
MA 4.3: Talk
Monday, March 8, 2004, 10:45–11:00, H22
Search for structural relaxations upon spin reorientation of Ni-monolayers by x-ray diffraction and MOKE — •Meyerheim H. L.1, Sander D.1, Popescu R.1, Robach O.2, Ferrer S.2, and Kirschner J.1 — 1MPI für Mikrostrukturphysik, Weinberg 2, 06120 Halle, Germany — 2ESRF, BP 220, F-38043 Grenoble, France
Using surface x-ray diffraction (SXRD) and magneto-optical Kerr effect (MOKE) measurements, the correlation between adlayer induced spin reorientation and structure relaxation was investigated in the trilayer system Ni/Fe/Ni on W(110). While the deposition of one Fe layer on the Ni film [Ni-thickness: 5, 8 and 10 layers on W(110)] induces a switching of the easy axis from in-plane to out-of-plane, subsequent deposition of another Ni layer reverts the easy axis back to in-plane. SXRD measurements along the reciprocal lattice rods before and after ad-layer deposition indicate that changes of peak positions, if present at all, must be below about 5×10−4 reciprocal lattice units. This corresponds to a change in the interlayer spacing in the order of 0.002 Åand represents the limit of the experimental accuracy. The analysis of the peak shapes does not provide any evidence for film structure in-homogeneities. The results are discussed in terms of strain and surface contributions to the magnetic anisotropy.